Evolution of Temperature Profiles during Stress-Induced Transformation in NiTi Thin Films
- 著者名:
- 掲載資料名:
- European Symposium on Martensitic Transformations : Selected, peer reviewed papers from the 9th European Symposium on Martensitic Transformations ESOMAT 2012, September 9-16, 2012, Saint-Petersburg, Russia
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 738-739
- 発行年:
- 2013
- 開始ページ:
- 287
- 終了ページ:
- 291
- 総ページ数:
- 5
- 出版情報:
- Aedermannsdorf, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
類似資料:
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
8
国際会議録
Correlation of Stress and Phase Evolution in Thin Ta Films on Si (100) During Thermal Testing
Materials Research Society |
Trans Tech Publications |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
MRS - Materials Research Society |