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Investigations on the Origin of the Ohmic Behavior for Ti/Al Based Contacts on n-Type GaN

著者名:
掲載資料名:
HeteroSiC & WASMPE 2011 : selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMPE 2011), June 27-30, 2011, Tours, France
シリーズ名:
Materials science forum
シリーズ巻号:
711
発行年:
2012
開始ページ:
208
終了ページ:
212
総ページ数:
5
出版情報:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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