Structural Characterization of Graphene Grown by Thermal Decomposition of Off-Axis 4H-SiC (0001)

Structural Characterization of Graphene Grown by Thermal Decomposition of Off-Axis 4H-SiC (0001)

著者名:

掲載資料名:

HeteroSiC & WASMPE 2011 : selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMPE 2011), June 27-30, 2011, Tours, France

シリーズ名:

Materials science forum

シリーズ巻号:

711

発行年:

2012

開始ページ:

141

終了ページ:

148

総ページ数:

8

出版情報:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00054202
シリーズID:	PA00000012
会議名:	Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMPE 2011)
回次:	4th
会議開催地:	Tours, France
会議開催年:	2011.06.27-2011.06.30
論文注記:	4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMPE 2011), June 27-30, 2011, Tours, France

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