Dielectric Properties of PMMA-SiO<sub>2</sub> Hybrid Films

Dielectric Properties of PMMA-SiO₂ Hybrid Films

著者名:

掲載資料名:

Advanced electron microscopy and nanomaterials : selected, peer reviewed papers from the First Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials (AEM-NANOMAT '09), Saltillo (Coahuila) Mexico, September 29th-October 2nd, 2009

シリーズ名:

Materials science forum

シリーズ巻号:

644

発行年:

2010

開始ページ:

25

終了ページ:

28

総ページ数:

4

出版情報:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00054154
シリーズID:	PA00000012
会議名:	Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials (AEM-NANOMAT '09)
回次:	1st
会議開催地:	Saltillo (Coahuila) Mexico
会議開催年:	2009.09.29-2009.10.02
論文注記:	First Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials (AEM-NANOMAT '09), Saltillo (Coahuila) Mexico, September 29th-October 2nd, 2009

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Dielectric Properties of PMMA-SiO2 Hybrid Films

類似資料:

Dielectric Properties of PMMA-SiO₂ Hybrid Films