Chemical-Mechanical Polishing of Wafers with Copper Film by Nano-Scale Abrasives
- 著者名:
- 掲載資料名:
- Advanced manufacture : focusing on new and emerging technologies : selected peer reviewed papers from the 2007 International Conference on Advanced Manufacture, Tainan, Taiwan, R.O.C., November 26-November 28, 2007
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 594
- 発行年:
- 2008
- 開始ページ:
- 181
- 終了ページ:
- 186
- 総ページ数:
- 6
- 出版情報:
- Aedermannsdorf, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
類似資料:
1
テクニカルペーパー
Analysis of the Tribological Mechanisms Arising in the Chemical Mechanical Polishing of Copper-Film Wafers.
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5
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Effects of Nano-scale Colloidal Abrasive Particle Size on SiO2 by Chemical Mechanical Polishing
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