Blank Cover Image

Corner Effect on Capacitance-Voltage Curves in Triple Gate FinFET

著者名:
掲載資料名:
Microelectonics Technology and Devices - SBMicro 2008
シリーズ名:
ECS transactions
シリーズ巻号:
14(1)
発行年:
2008
開始ページ:
223
終了ページ:
231
総ページ数:
9
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781566776462 [1566776465]
言語:
英語
請求記号:
E23400/14-1
資料種別:
国際会議録

類似資料:

1 国際会議録 Triple Gate FinFET Parameter Extraction Using High Frequency Capacitance - Voltage Curves

M. Rodrigues, V. Sonnenberg, J. A. Martino

Electrochemical Society
7 国際会議録 Low Temperature Operation of Undoped Body Triple-Gate FinFETs from an Analog Perspective

M. A. Pavanello, J. A. Martino, E. Simoen, R. Rooyackers, N. Collaert, C. Claeys

Electrochemical Society
2 国際会議録 Simple Method to Determine the Poly Gate Doping Concentration Based on Poly Depletion Effect

Rodrigues, M., Sonnenberg, V., Martino, J. A.

Electrochemical Society
8 国際会議録 Determination of the Silicon Film Doping Concentration and the Back Interface Oxide Charge Density using SOI-NMOS Gate Capacitor

Sonnenberg, V., Martino, J.A.

Electrochemical Society
3 国際会議録 Non-Vertical Sidewall Angle Influence on Triple-Gate FinFETs Corner Effects

R. Giacomini, J. A. Martino

Electrochemical Society
9 国際会議録 Influence of Fin Width on the Intrinsic Voltage Gain of Standard and Strained Triple-Gate nFinFETs

M.A. Pavanello, J.A. Martino, E. Simoen, R. Rooyackers, N. Collaert

Electrochemical Society
4 国際会議録 Analysis of the Capacitance vs. Voltage in Graded Channel SOI Capacitor

Sonnenberg, V., Martino, J.A.

Electrochemical Society
10 国際会議録 Evaluation of Triple-Gate Finfets with High-k Dielectrics and TiN Gate Material Under Analog Operation

Marcelo Pavanello, Joao Martino, Eddy Simoen, Rita Rooyackers, Nadine Collaert, Cor Claeys

Electrochemical Society
5 国際会議録 Influence of the Tunneling Gate Current in C-V Curves

Michele Rodrigues, Victor Sonnenberg, João Antonio Martino

Electrochemical Society
11 国際会議録 A Simple Method to Extract the Oxide Charge Density at the Buried Oxide/Substrate Interface in SOI Capacitor

Sonnenberg, V, Martino, J

Electrochemical Society
6 国際会議録 Carriers Mobility Extraction Methods for Triple-gate FinFET

C.D. Santos, J.A. Martino

Electrochemical Society
12 国際会議録 Determination of Silicon Film Doping Concentration and Back Oxide Charge Density using SOI-MOS Capacitor

Sonnenberg, V., Martino, J.A.

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12