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In-Line Characterization of Heterojunction Bipolar Transistor Base Layers by High-Resolution X-Ray Diffraction

著者名:
掲載資料名:
Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007) (plus Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes)
シリーズ名:
ECS transactions
シリーズ巻号:
10(1)
発行年:
2007
開始ページ:
151
終了ページ:
160
総ページ数:
10
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781604238259 [1604238259]
言語:
英語
請求記号:
E23400/10-1
資料種別:
国際会議録

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