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Electrical Performance and Reliability Aspects of Strain Engineered Deep Submicron CMOS Technologies

著者名:
掲載資料名:
2007 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT)
シリーズ名:
ECS transactions
シリーズ巻号:
8(1)
発行年:
2007
開始ページ:
15
終了ページ:
22
総ページ数:
8
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781604238921 [1604238925]
言語:
英語
請求記号:
E23400/8-1
資料種別:
国際会議録

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