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The Abnormal Degradation Behavior of ZnO TFT Under Gate Bias Stress

著者名:
掲載資料名:
Thin Film Transistor Technology 8
シリーズ名:
ECS transactions
シリーズ巻号:
3(8)
発行年:
2006
開始ページ:
301
終了ページ:
305
総ページ数:
5
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781566775083 [1566775086]
言語:
英語
請求記号:
E23400/3-8
資料種別:
国際会議録

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