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The Defect Classification of TFT-LCD Array Photolithography Process via Using Back-Propagation Neural Network

著者名:
掲載資料名:
Applied mechanics, materials and manufacturing : selected, peer reviewed papers from the 2013 International Conference on Applied Mechanics, Materials, and Manufacturing (AMMM 2013) : Hong Kong, China 17-18 August 2013
シリーズ名:
Applied mechanics and materials
シリーズ巻号:
378
発行年:
2014
開始ページ:
340
終了ページ:
345
総ページ数:
6
出版情報:
Stafa-Zuerich: Trans Tech Publications
ISSN:
16609336
ISBN:
9781629936437 [162993643X]
言語:
英語
請求記号:
A69500/378
資料種別:
国際会議録

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