Interfacial and Electrical Characterization of HfO2-Gated MOSCs and MOSFETs by C-V and Gated-Diode Method
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Electrical Characterization of GaN Metal Oxide Semiconductor Diodes Using MgO As The Gate Oxide
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Electrical Characterization of GaN Metal Oxide Semiconductor Diode Using Sc2O3 as the Gate Oxide
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