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Quality assurance and management in microelectronics companies: ISO 9000 versus Six Sigma

著者名:
掲載資料名:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7297
発行年:
2009
開始ページ:
72972L-1
終了ページ:
72972L-6
総ページ数:
6
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819475596 [0819475599]
言語:
英語
請求記号:
P63600/7297
資料種別:
国際会議録

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