Method of circle detection in PCB optics image based on improved point Hough transform

著者名:

• N. Qiao ( Univ. of Electronic Science and Technology of China, China )
• Y. Ye ( Univ. of Electronic Science and Technology of China, China )
• Y. Huang ( Univ. of Electronic Science and Technology of China, China )
• L. Liu ( Univ. of Electronic Science and Technology of China, China )
• Y. Wang ( Univ. of Electronic Science and Technology of China, China )

掲載資料名:

4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

7283

発行年:

2009

巻:

2

開始ページ:

72832Y-1

終了ページ:

72832Y-5

総ページ数:

5

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819475435 [0819475432]

言語:

英語

請求記号:

P63600/7283

資料種別:

国際会議録