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Frequency-domain analysis on the optical surface accuracy

著者名:
  • Q. Huang ( Beijing Institute of Technology, China )
  • H. Cheng ( Beijing Institute of Technology, China )
  • Y. Wang ( Beijing Institute of Technology, China )
  • P. Wang ( Shanghai Institute of Technical Physics, China )
  • L. Wu ( Shanghai Institute of Technical Physics, China )
掲載資料名:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7282
発行年:
2009
巻:
2
開始ページ:
72823W-1
終了ページ:
72823W-5
総ページ数:
5
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819475428 [0819475424]
言語:
英語
請求記号:
P63600/7282
資料種別:
国際会議録

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