Blank Cover Image

Wavelet threshold denoising with four families of mother wavelets for hyperspectral data

著者名:
  • L. Jiang ( Beijing Institute of Technology, China )
  • X. Chen ( Beijing Institute of Technology, China )
  • G. Ni ( Beijing Institute of Technology, China )
掲載資料名:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7156
発行年:
2008
巻:
2
開始ページ:
71564D-1
終了ページ:
71564D-8
総ページ数:
8
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819474001 [0819474002]
言語:
英語
請求記号:
P63600/7156
資料種別:
国際会議録

類似資料:

L. Jiang, X. Chen, G. Ni, S. Ge

Society of Photo-optical Instrumentation Engineers

C. Chen, F. Peng, Q. Cheng, D. Xu

Society of Photo-optical Instrumentation Engineers

Marpe, D., Cycon, H.L., Zander, G., Barthel, K.-U.

SPIE-The International Society for Optical Engineering

Y. Zhao, J. Li, L. Xia

Society of Photo-optical Instrumentation Engineers

C. Yu, H. Qin, L. Zhang

Society of Photo-optical Instrumentation Engineers

Beaven,S.G., Yu,X., Hoff,L.E., Chen,A.M., Winter,E.M.

SPIE-The International Society for Optical Engineering

Z. Ren, G. Liu, L. Zeng, Z. Huang, S. Huang

Society of Photo-optical Instrumentation Engineers

Shi, H., Cai, Y., Qiu, Z.

SPIE-The International Society for Optical Engineering

P. Zhang, M. Hu, N. Ma, C. He

Society of Photo-optical Instrumentation Engineers

W. Zhu, Z. Zhao, X. Guo, L. Wang, H. Chen

Society of Photo-optical Instrumentation Engineers

Chen,C.W., Jiang,J., Zheng,Z., Wu,X.G., Yu,L.

SPIE - The International Society for Optical Engineering

Chen, G., Tang, L., Dai, C., Jiang, X.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12