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Trace H2S monitoring based on off-axis integrated cavity output spectroscopy

著者名:
  • D. Yu ( Hangzhou Dianzi Univ., China )
  • X. Li ( Focused Photonics Inc., China )
  • H. Gu ( Hangzhou Dianzi Univ., China )
  • X. Gao ( Hangzhou Dianzi Univ., China )
  • W. Huang ( Focused Photonics Inc., China )
掲載資料名:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7156
発行年:
2008
巻:
2
開始ページ:
715627-1
終了ページ:
715627-6
総ページ数:
6
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819474001 [0819474002]
言語:
英語
請求記号:
P63600/7156
資料種別:
国際会議録

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