Blank Cover Image

An adaptive morphological algorithm to segment Chinese square seal in bank check image

著者名:
  • J. He ( Tianjin Univ., China )
  • T. Liu ( Tianjin Univ., China )
  • Z. Zhang ( Tianjin Univ., China )
掲載資料名:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7156
発行年:
2008
巻:
1
開始ページ:
71560Y-1
終了ページ:
71560Y-12
総ページ数:
12
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819474001 [0819474002]
言語:
英語
請求記号:
P63600/7156
資料種別:
国際会議録

類似資料:

S. Wang, T. Liu

Society of Photo-optical Instrumentation Engineers

Boussalis, H., Liu, C., Rad, K., Dong, J.

SPIE - The International Society of Optical Engineering

Yong,T., He,Q., Jin,G., Liu,H., Wu,M., Yan,Y.

SPIE-The International Society for Optical Engineering

S. He, W. Li, L. Hu, Y. Wang, T. Zhang

ESA Communication Production Office

He Y., Pan J., Zhang Y.

SPIE - The International Society of Optical Engineering

Pan,L., Zhang,J., Zhang,Z.

SPIE-The International Society for Optical Engineering

Li, Y., Wang, J., Zhang, J., He, T.

SPIE - The International Society of Optical Engineering

Zhang, Y., Liu, W.-Y., Zheng, W., Hao, Y.-J., Wang, J.-T.

SPIE-The International Society for Optical Engineering

Li,W., Haese-Coat,V., Ronsin,J.

SPIE-The International Society for Optical Engineering

X. Wang, J. He, X. Li, M. He

Society of Photo-optical Instrumentation Engineers

Liu, Y., Chen, Y., Xiong, J., He, Y., Yu, F.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12