An electron analyzer
- 著者名:
- A.-B. Zhang ( Ctr. for Space Science and Applied Research, China )
- L.-G. Kong ( Ctr. For Space Science and Applied Research, China )
- S.-J. Wang ( Ctr. For Space Science and Applied Research, China )
- L. Li ( Ctr. For Space Science and Applied Research, China )
- X.-Z. Zheng ( Ctr. For Space Science and Applied Research, China )
- 掲載資料名:
- Sensors and instruments, computer simulation, and artificial intelligence : Seventh International Symposium on Instrumentation and Control Technology : 10-13 October, 2008, Beijing, China
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 7127
- 発行年:
- 2008
- 開始ページ:
- 71271A-1
- 終了ページ:
- 71271A-7
- 総ページ数:
- 7
- 出版情報:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819473615 [0819473618]
- 言語:
- 英語
- 請求記号:
- P63600/7127
- 資料種別:
- 国際会議録
類似資料:
Trans Tech Publications |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Materials Research Society |
4
国際会議録
InGaAs trap detector used as a neor-intrcred transfer standard for detector calibrations [6150-120]
SPIE - The International Society of Optical Engineering |
Materials Research Society |
SPIE - The International Society of Optical Engineering |
Trans Tech Publications |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |