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Ray traces of an arbitrarily deformed double-crystal Laue x-ray monochromator

著者名:
掲載資料名:
Advances in x-ray/EUV optics and components III : 11-13 August 2008, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7077
発行年:
2008
開始ページ:
70771N-1
終了ページ:
70771N-12
総ページ数:
12
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819472977 [0819472972]
言語:
英語
請求記号:
P63600/7077
資料種別:
国際会議録

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