Blank Cover Image

Teledyne Imaging Sensors: silicon CMOS imaging technologies for x-ray, UV, visible, and near infrared

著者名:
  • Y. Bai ( Teledyne Imaging Sensors, United States )
  • J. Bajaj ( Teledyne Imaging Sensors, United States )
  • J. W. Beletic ( Teledyne Imaging Sensors, United States )
  • M. C. Farris ( Teledyne Imaging Sensors, United States )
  • A. Joshi ( Teledyne Imaging Sensors, United States )
掲載資料名:
High energy, optical, and infrared detectors for astronomy III
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7021
発行年:
2008
開始ページ:
702102-1
終了ページ:
702102-16
総ページ数:
16
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819472311 [081947231X]
言語:
英語
請求記号:
P63600/7021
資料種別:
国際会議録

類似資料:

Bai, Y., Farris, M. C., Joshi, A., Hosack, J. R., Bajaj, J., Montroy, J. T.

SPIE - The International Society of Optical Engineering

Montroy, J.T., Garnett, J.D., Cabelli, S.A., Loose, M., Joshi, A.B., Hughes, G.W., Kozlowski, L.J., Haas, A.K., Wong, …

SPIE-The International Society for Optical Engineering

J. W. Beletic, R. Blank, D. Gulbransen, D. Lee, M. Loose

Society of Photo-optical Instrumentation Engineers

Marguia,J.E., Reeves,T.D., Mooney,J.M., Ewing,W.S., Shepherd,F.D., Brodzik,A.K.

SPIE - The International Society for Optical Engineering

Y. Bai, M. C. Farris, A. K. Petersen, J. W. Beletic

SPIE - The International Society of Optical Engineering

Rao,C.R.N., Chen,J., Sullivan,J. T., Zhang,N., Wang,W.

SPIE-The International Society for Optical Engineering

Bai, Y., Farris, M. C., Joshi, A., Chuh, T. Y.

SPIE - The International Society of Optical Engineering

Theiヲツ, W., Arens-Fischer, R., Arntzen, M., Berger, M. G., Frohnhoff, S., Hilbrich, S., Wernke, M.

MRS - Materials Research Society

Bai, Y., Bernd, S.G., Hosack, J.R., Farris, M.C., Montroy, J.T., Bajaj, J.

SPIE - The International Society of Optical Engineering

A. D. Falcone, D. N. Burrows, Y. Bai, M. Farris, R. Cook

Society of Photo-optical Instrumentation Engineers

Bai,Y., Montroy,J.T., Blackwell,J.D., Farris,M.C., Kozlowski,L.J., Vural,K.

SPIE - The International Society for Optical Engineering

Budrys, A. J., Cao, M., Greene, W., Kooi, G., Lin, J., Ma, S., Ray, G. W., Stork, H., Theil, J. A., Yoon, U.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12