Blank Cover Image

New measures in controlling quality of VLT VISIR

著者名:
掲載資料名:
Observatory operations : strategies, processes, and systems II : 24-26 May, 2008, Marseiile, France
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7016
発行年:
2008
開始ページ:
70161H-1
終了ページ:
70161H-6
総ページ数:
6
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819472267 [0819472263]
言語:
英語
請求記号:
P63600/7016
資料種別:
国際会議録

類似資料:

Dobrzycka, D., Smette, A., Sterzik, M., Lundin, L., Jung, Y., Siebenmorgen, R.

SPIE - The International Society of Optical Engineering

Rio,Y., Lagage,P.O., Dubreuil,D., Durand,G.A., Lyraud,C., Pel,J.W., de Haas,J.C., Schoenmaker,A., Tolsma,H.

SPIE-The International Society for Optical Engineering

Dobrzycka, D., Hummel, W., Lidman, C., Ageorges, N., Marco, O., Jung, Y.

SPIE - The International Society of Optical Engineering

Hanuschik, R. W., Hummel, W., Sartoretti, P., Silva, D. R.

SPIE-The International Society for Optical Engineering

3 国際会議録 Lessons learned from VISIR

E. Pantin, C. Doucet, H. U. Käufl, P. O. Lagage, R. Siebenmorgen

Society of Photo-optical Instrumentation Engineers

Kaeufl, H. U., Sterzik, M.F., Siebenmorgen, R., Relke, H., Stecklum, B.

SPIE-The International Society for Optical Engineering

Moorwood, A.F.M., Biereichel, P., Brynnel, J., Delabre, B., Dorn, R.J., Finger, G., Franza, F., Huster, G., Jung, Y., …

SPIE-The International Society for Optical Engineering

Kaeufl, H.-U., Sterzik, M.F., Siebenmorgen, R., Weilenmann, U., Relke, H., Hron, J., Sperl, M.

SPIE-The International Society for Optical Engineering

Hanuschik, R. W., Kaufer, A., Modigliani, A., D'Odorico, S., Dekker, H.

SPIE-The International Society for Optical Engineering

Y. Rio, P.-O. Lagage, D. Dubreuil, T. Tourrette, G. Dhenain

Society of Photo-optical Instrumentation Engineers

Hummel, W., Johnson, R., Jung, Y., Lundin, L. K.

SPIE - The International Society of Optical Engineering

Claret, A.J., Lagage, P.-O., Pantin, E., Dubreuil, D., Galdemard, P., Schoemnaker, A., Pei, J.W.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12