Measuring near-field optical distributions emitted from chip surface of photonic crystal patterned light emitting diodes
- 著者名:
- K.-D. Park ( Inha Univ., South Korea )
- W.-S. Ji ( Samsung Electro-Mechanics Co. Ltd., South Korea )
- D.-S. Park ( Inha Univ., South Korea )
- D. -C. Kim ( Inha Univ., South Korea )
- B. -H. O ( Inha Univ., South Korea )
- 掲載資料名:
- Nanophotonics II : 7-9 April 2008, Strasbourg, France
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6988
- 発行年:
- 2008
- 開始ページ:
- 69880P-1
- 終了ページ:
- 69880P-11
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819471864 [0819471860]
- 言語:
- 英語
- 請求記号:
- P63600/6988
- 資料種別:
- 国際会議録
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