FAAD: face at a distance
- 著者名:
- T. E. Boult ( Univ. of Colorado, Colorado Springs, USA )
- W. J. Scheirer ( Univ. of Colorado, Colorado Springs, USA )
- R. Woodworth ( Securics, Inc., USA )
- 掲載資料名:
- Biometric technology for human identification V : 18-19 March 2008, Orlando, Florida, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6944
- 発行年:
- 2008
- 開始ページ:
- 694402-1
- 終了ページ:
- 694402-9
- 総ページ数:
- 9
- 出版情報:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819471352 [0819471356]
- 言語:
- 英語
- 請求記号:
- P63600/6944
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
Electrochemical Society |
SPIE - The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
ESA Publications Division |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
12
国際会議録
Growth and polarity control of GaN and AlN on carbon-face SiC by metalorganic vapor phase epitaxy
SPIE - The International Society of Optical Engineering |