Enhanced statistical damage identification using frequency shift information with tunable piezoelectric circuitry

Enhanced statistical damage identification using frequency shift information with tunable piezoelectric circuitry

著者名:

J. Zhao ( Univ. of Connecticut, USA )
J. Tang ( Univ. of Connecticut, USA )

掲載資料名:

Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2008

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6932

発行年:

2008

巻:

2

開始ページ:

69323E-1

終了ページ:

69323E-15

総ページ数:

15

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819471185 [0819471186]

言語:

英語

請求記号:

P63600/6932

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052563
シリーズID:	PA00000029
会議名:	Smart Structures : Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems
回次:	2008
会議開催地:	San Diego, California, USA
会議開催年:	2008.03.10-2008.03.13
論文注記:	Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2008, 10-13 March 2008, San Diego, California, USA. Session 26. Signal Processing and Damage Detection II, 69323E, 6932-124

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