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Optical proximity correction with principal component regression

著者名:
  • P. Gao ( Univ. of California at Berkeley, USA )
  • A. Gu ( Univ. of California at Berkeley, USA )
  • A. Zakhor ( Univ. of California at Berkeley, USA )
掲載資料名:
Optical Microlithography XXI
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6924
発行年:
2008
巻:
3
開始ページ:
69243N-1
終了ページ:
69243N-18
総ページ数:
18
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819471093 [0819471097]
言語:
英語
請求記号:
P63600/6924
資料種別:
国際会議録

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