Porosity characteristics of ultra-low dielectric insulator films directly patterned by nano- imprint .lithography
- 著者名:
- H. W. Ro ( NIST, USA )
- R. L. Jones ( NIST, USA )
- H. Peng ( Univ. of Michigan, USA )
- H.-J. Lee ( NIST, USA )
- E. K. Lin ( NIST, USA )
- 掲載資料名:
- Emerging lithographic technologies XII
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6921
- 発行年:
- 2008
- 巻:
- 1
- 開始ページ:
- 69211M-1
- 終了ページ:
- 69211M-11
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819471062 [0819471062]
- 言語:
- 英語
- 請求記号:
- P63600/6921
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
Trans Tech Publications |
2
国際会議録
Characterizing nano-imprint pattern cross-section and fidelity from x-ray reflectivity [6151-23]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |