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Interface roughness estimate from carrier transport in InAs/GaSb superlattices

著者名:
掲載資料名:
Quantum sensing and nanophotonic devices V : 20-23 January 2008, San Jose, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6900
発行年:
2008
開始ページ:
69000P-1
終了ページ:
69000P-9
総ページ数:
9
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819470751 [0819470759]
言語:
英語
請求記号:
P63600/6900
資料種別:
国際会議録

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