High-speed image acquisition synchronized with the motion of galvanometer scanner for confocal microscopy

High-speed image acquisition synchronized with the motion of galvanometer scanner for confocal microscopy

著者名:

Y. S. Bae ( Gwangju Institute of Science and Technology, South Korea )
S. Moon ( Gwangju Institute of Science and Technology, South Korea )
D. Y. Kim ( Gwangju Institute of Science and Technology, South Korea )

掲載資料名:

Three-dimensional and multidimensional microscopy : image acquisition and processing XV : 21 and 23-24 January 2008, San Jose, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6861

発行年:

2008

開始ページ:

686116-1

終了ページ:

686116-8

総ページ数:

8

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

16057422

ISBN:

9780819470362 [0819470368]

言語:

英語

請求記号:

P63600/6861

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052492
シリーズID:	PA00000029
会議名:	SPIE BiOS : Three-Dimensional and Multidimensional Microscopy
回次:	2008 : 15th
会議開催地:	San Jose, California, USA
会議開催年:	2008.01.21,2008.01.23-2008.01.24
論文注記:	Three-dimensional and multidimensional microscopy: Image Acquisition and Processing XV, 21,23-24 January 2008, San Jose, California, USA - Poster Session (686116/6861-45)

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