Surface shape parameters and analysis of data captured with use of 4D surface scanners
- 著者名:
- M. Witkowski ( Warsaw Univ. of Technology, Poland )
- R. Sitnik ( Warsaw Univ. of Technology, Poland )
- W. Rapp ( Univ. Tübingen, Germany )
- B. Haex ( Katholieke Univ. Leuven, Belgium )
- M. Kowalski ( Smarttech Sp. z o. o., Poland )
- 掲載資料名:
- Advanced biomedical and clinical diagnostic systems VI : 20-21 January 2008, San Jose, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6848
- 発行年:
- 2008
- 開始ページ:
- 684815-1
- 終了ページ:
- 684815-11
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 16057422
- ISBN:
- 9780819470232 [0819470236]
- 言語:
- 英語
- 請求記号:
- P63600/6848
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
American Institute of Chemical Engineers |
SPIE - The International Society of Optical Engineering |
American Chemical Society |
SPIE - The International Society of Optical Engineering |
9
国際会議録
3DMADMAC system: optical 3D shape acquisition and processing path for VR applications [5857-13]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
American Chemical Society |
SPIE - The International Society for Optical Engineering |