Blank Cover Image

Scene simulation optics in testing of dual-field angle infrared imagers

著者名:
  • Y. Zheng ( Xi'an Institute of Applied Optics, China )
  • J. Gao ( Xi'an Institute of Applied Optics, China )
  • J. Wang ( Xi'an Institute of Applied Optics, China )
  • H. Chen ( Xi'an Institute of Applied Optics, China )
掲載資料名:
Optical Design and Testing III
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6834
発行年:
2008
巻:
2
開始ページ:
68343X-1
終了ページ:
68343X-8
総ページ数:
8
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819470096 [0819470090]
言語:
英語
請求記号:
P63600/6834
資料種別:
国際会議録

類似資料:

Zheng, Y., Gao, J., Wang, J., Chen, H.

SPIE - The International Society of Optical Engineering

Gao,J., Ye,K., Wang,J., Chen,H., Jiang,P., Zhang,C.

SPIE-The International Society for Optical Engineering

Y. Hu, J. Gao, J. Wang, Y. Zheng

Society of Photo-optical Instrumentation Engineers

I. R. Corbin, J. Chen, H. Li, W. Cao, G. Zheng

SPIE - The International Society of Optical Engineering

Couture,M.E.

SPIE - The International Society for Optical Engineering

K. Gao, H. Yang, X. Chen, G. Ni

Society of Photo-optical Instrumentation Engineers

S.S. Lian, I.H. Wang, J.J. Ke

Trans Tech Publications

Wang, Z., Gao, C., Tian, J., Liu, J., Chen, X.

SPIE - The International Society of Optical Engineering

Q. Wang, H. Zhang, C. Wang, Y. Tang

Society of Photo-optical Instrumentation Engineers

H. Wang, A. Geng, C. Yang, Q. Cao, L. Guo

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12