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A subpixel localization method based on edge diffraction

著者名:
掲載資料名:
Optical Design and Testing III
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6834
発行年:
2008
巻:
2
開始ページ:
68342M-1
終了ページ:
68342M-4
総ページ数:
4
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819470096 [0819470090]
言語:
英語
請求記号:
P63600/6834
資料種別:
国際会議録

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