Textural features based universal steganalysis

Textural features based universal steganalysis

著者名:

B. Li ( Sun Yat-Sen Univ., China )
J. Huang ( Sun Yat-Sen Univ., China )
Y. Q. Shi ( New Jersey Institute of Technology, USA )

掲載資料名:

Security, forensics, steganography, and watermarking of multimedia contents X : 28-30 January 2008, San Jose, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6819

発行年:

2008

開始ページ:

681912-1

終了ページ:

681912-12

総ページ数:

12

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819469915 [0819469912]

言語:

英語

請求記号:

P63600/6819

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052450
シリーズID:	PA00000029
会議名:	IS&T/SPIE Electronic Imaging : Security, Forensics, Steganography, and Watermarking of Multimedia Contents
回次:	2008 : 10th
会議開催地:	San Jose, California, USA
会議開催年:	2008.01.28-2008.01.30
論文注記:	Security, forensics, steganography, and watermarking of multimedia contents X, 28-30 January 2008, San Jose, California, USA - Session 9. Steganalysis (6819-38)

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