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SoC variability evaluation and reduction

著者名:
掲載資料名:
Microelectronics : design, technology, and packaging III : 5-7 December 2007, Canberra, Australia
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6798
発行年:
2008
開始ページ:
67980I-1
終了ページ:
67980I-8
総ページ数:
8
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469694 [0819469696]
言語:
英語
請求記号:
P63600/6798
資料種別:
国際会議録

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