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Design of remote fault diagnosis based on OPC and XML

著者名:
  • Y. Chen ( Chongqing Institute of Technology, China )
  • L. Huang ( Chongqing Institute of Technology, China )
  • J. Zhang ( Chongqing Institute of Technology, China )
掲載資料名:
ICMIT 2007, mechatronics, MEMS, and smart materials
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6794
発行年:
2008
巻:
2
開始ページ:
679459-1
終了ページ:
679459-6
総ページ数:
6
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469595 [0819469599]
言語:
英語
請求記号:
P63600/6794
資料種別:
国際会議録

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