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Fast algorithm for document skew detection method using run-length smoothing, Hough transform, mathematical morphology and wavelet

著者名:
  • F. Guo ( Information Engineering Univ., China )
  • X. Chen ( Academy of Equipment Command and Technology, China )
  • J. Li ( Academy of Equipment Command and Technology, China )
掲載資料名:
MIPPR 2007
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6786
発行年:
2007
巻:
1
開始ページ:
67862T-1
終了ページ:
67862T-8
総ページ数:
8
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469502 [0819469505]
言語:
英語
請求記号:
P63600/6786
資料種別:
国際会議録

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