Blank Cover Image

Primary study on ellipsometry of large roughness surface

著者名:
  • Z. Huang ( South China Normal Univ., China )
  • L. Wang ( South China Normal Univ., China )
  • Z. He ( South China Normal Univ., China )
  • J. Chen ( South China Normal Univ., China )
掲載資料名:
Optical test and measurement technology and equipment
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6723
発行年:
2007
巻:
2
開始ページ:
67233U-1
終了ページ:
67233U-5
総ページ数:
5
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819468802 [0819468800]
言語:
英語
請求記号:
P63600/6723
資料種別:
国際会議録

類似資料:

1 国際会議録 Surface roughness measurement using infrared phase-shifting digital interferometer

He, Y., Chen, L., Wang, Q., Chen, J.B.

SPIE-The International Society for Optical Engineering
7 国際会議録 SURFACE ROUGHNESS CHARACTERIZATION OF Al FILMS BY SPECTROSCOPIC ELLIPSOMETRY

Blanco, J.R., Vedam, K., McMarr, P.J., Bennett, J.M.

Materials Research Society
2 国際会議録 Experimental Investigation on Heat Transfer and Pressure Drop in a Microtubine Recuperator With Cross-Wavy Primary Surface Channels

Q. W. Wang, H. X. Liang, L. Q. Luo, J. W. Wang, Z. P. Huang, Z. P. Feng, Z. Q. Chen

American Society of Mechanical Engineers
8 国際会議録 Surface Roughness Characterization of Au Thin Films by Spectroscopic Ellipsometry, Grazing X-ray Reflectance, Light Scattering and Scanning Tunneling Microscopy

Boher, P., Stehle, J. L.

MRS - Materials Research Society
3 国際会議録 Effect of ambient light on surface roughness inspection

Z. Chen, Z. Zhang, J. Shi, R. Chen, R. Huang

Society of Photo-optical Instrumentation Engineers
9 国際会議録 Study of interdiffusion in HgCdTe/CdZnTe structures by infrared transmission spectroscopy

Huang,G., Yang,J., Chen,X., Fang,W., Huang,Z., He,L.

SPIE-The International Society for Optical Engineering
4 国際会議録 Study on the Relationship between Surface Roughness and Texture Features of Engineering Ceramics

X.L. Tian, J.Q. Wang, F. Guo

Trans Tech Publications
10 国際会議録 Spectroscopic ellipsometry characterization of the interfacial roughness in SIMOX wafer

Li, W.J., Song, Z.R., Tao, K., Yu, Y.H., Wang, X., Zou, S.C.

Electrochemical Society
5 国際会議録 A Study on the Microstructure of Ti(C, N) Matrix Cermet Tool Material

Huang, C. Z., He, L., Wang, J., Liu, H. L.

Trans Tech Publications
11 国際会議録 Spectroscopic study on second-harmonic generation from a reconstructed silicon surface

Chen,J., Huang,D.

SPIE - The International Society for Optical Engineering
6 国際会議録 A study of computer vision for ground surface roughness evaluation

X. Liu, C. Wu, L. Wang, L. Liu, P. Wang

Society of Photo-optical Instrumentation Engineers
12 国際会議録 HIGH-RESOLUTION LEED STUDY OF INTERMIXING OF Fe FILMS ON Au(001) SURFACE

He, Y. -L., Wang, G. -C.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12