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Phase transition characteristics of tungsten and tantalum doped VO2 polycrystalline thin films formed by ion beam enhanced deposition

著者名:
  • J. Li ( Jiangsu Polytechnic Univ., China )
  • D. Dan ( Jiangsu Polytechnic Univ., China )
  • N. Yuan ( Jiangsu Polytechnic Univ., China )
  • T. Xie ( Jiangsu Polytechnic Univ., China )
掲載資料名:
Optical test and measurement technology and equipment
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6723
発行年:
2007
巻:
1
開始ページ:
672310-1
終了ページ:
672310-5
総ページ数:
5
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819468802 [0819468800]
言語:
英語
請求記号:
P63600/6723
資料種別:
国際会議録

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