Super-resolved imaging system with oversampling technology

Super-resolved imaging system with oversampling technology

著者名:

X. Zhang ( Changchun Institute of Optics, Fine Mechanics and Physics, China )
Y. Liu ( Changchun Institute of Optics, Fine Mechanics and Physics, China )
J. Zhang ( Changchun Institute of Optics, Fine Mechanics and Physics, China )
L. Wang ( Changchun Institute of Optics, Fine Mechanics and Physics, China )

掲載資料名:

Advanced optical manufacturing technologies

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6722

発行年:

2007

巻:

1

開始ページ:

672214-1

終了ページ:

672214-6

総ページ数:

6

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819468796 [0819468797]

言語:

英語

請求記号:

P63600/6722

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052368
シリーズID:	PA00000029
会議名:	International Symposium on Advanced Optical Manufacturing and Testing Technologies
回次:	2007 : 3rd
会議開催地:	Chengdu, China
会議開催年:	2007.07.08-2007.07.12
論文注記:	3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 8-12 July 2007, Chengdu, China - Session 2-6 (6722-39)

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