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The exponential fitting of optical threshold and analyses of testing errors

著者名:
  • D. Li ( Shanghai Institute of Optics and Fine Mechanics, China )
  • J. Shan ( Shanghai Institute of Optics and Fine Mechanics, China )
  • Y. Zhao ( Shanghai Institute of Optics and Fine Mechanics, China )
  • K. Yi ( Shanghai Institute of Optics and Fine Mechanics, China )
  • H. Qi ( Shanghai Institute of Optics and Fine Mechanics, China )
掲載資料名:
Laser-induced damage in optical materials : 2007 : 39th Annual Boulder Damage Symposium : proceedings : 24-26 September, 2007, Boulder, Colorado
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6720
発行年:
2007
開始ページ:
67200B-1
終了ページ:
67200B-7
総ページ数:
7
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819468772 [0819468770]
言語:
英語
請求記号:
P63600/6720
資料種別:
国際会議録

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