Image blur analysis for the subpixel-level measurement of in-plane vibration parameters of MEMS resonators

Image blur analysis for the subpixel-level measurement of in-plane vibration parameters of MEMS resonators

著者名:

H. V. Le ( Vietnam National Univ. (Vietnam) )
M. Gouiffes ( Institute d'Electronique Fondamentale (France) )
F. Parrain ( Institute d'Electronique Fondamentale (France) )
A. Bosseboeuf ( Institute d'Electronique Fondamentale (France) )
B. Zavidovique ( Institute d'Electronique Fondamentale (France) )

掲載資料名:

Applications of digital image processing XXX

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6696

発行年:

2007

巻:

2

開始ページ:

66962D-1

終了ページ:

66962D-12

総ページ数:

12

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819468444 [0819468444]

言語:

英語

請求記号:

P63600/6696

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052343
シリーズID:	PA00000029
会議名:	SPIE Optical Engineering and Applications : Applications of Digital Image Processing
回次:	2007 : 30th
会議開催地:	San Diego, California, USA
会議開催年:	2007.08.28-2007.08.30
論文注記:	Applications of Digital Image Processing XXX, August 28-30, 2007, San Diego, CA, USA - Poster Session (6696-81)

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