High-fidelity cryothermal test of a subscale large space telescope

High-fidelity cryothermal test of a subscale large space telescope

著者名:

M. DiPirro ( NASA Goddard Space Flight Ctr. (USA) )
J. Tuttle ( NASA Goddard Space Flight Ctr. (USA) )
S. Ollendorf ( NASA Goddard Space Flight Ctr. (USA) )
A. Mattern ( NASA Goddard Space Flight Ctr. (USA) )
D. Leisawitz ( NASA Goddard Space Flight Ctr. (USA) )

掲載資料名:

Cryogenic optical systems and instruments XII : 26-27 August 2007, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6692

発行年:

2007

開始ページ:

669202-1

終了ページ:

669202-9

総ページ数:

9

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819468406 [0819468401]

言語:

英語

請求記号:

P63600/6692

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052339
シリーズID:	PA00000029
会議名:	SPIE Optical Engineering and Applications : Cryogenic Optical Systems and Instruments
回次:	2007 : 12th
会議開催地:	San Diego, California, USA
会議開催年:	2007.08.26-2007.08.27
論文注記:	Cryogenic Optical Systems and Instruments XII, August 26-27, 2007, San Diego, CA, USA - Cryogenic Optical Properties and Instrument Technology I (6692-01)

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