Development of a Si:As blocked impurity band detector for far IR detection

Development of a Si:As blocked impurity band detector for far IR detection

著者名:

D. S. Tezcan ( IMEC (Belgium) )
J. Putzeys ( IMEC (Belgium) )
K. De Munck ( IMEC (Belgium) )
T. Souverijns ( IMEC (Belgium) )
P. Merken ( IMEC (Belgium) )

掲載資料名:

Infrared systems and photoelectronic technology II : 26-28 August 2007, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6660

発行年:

2007

開始ページ:

66600R-1

終了ページ:

66600R-12

総ページ数:

12

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819468086 [0819468088]

言語:

英語

請求記号:

P63600/6660

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052319
シリーズID:	PA00000029
会議名:	SPIE Organic Photonics and Electronics : Infrared Systems and Photoelectronic Technology
回次:	2007 : 2nd
会議開催地:	San Diego, California, USA
会議開催年:	2007.08.26-2007.08.28
論文注記:	Infrared systems and photoelectronic technology II, 26-28 August 2007, San Diego, CA, USA - Part A. Infrared Detectors and Focal Plane Arrays IX, Session 7. Silicon Technology (66600R)

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