Blank Cover Image

Low-damage wet chemical etching for GaN-based visible-blind p-i-n detector

著者名:
  • J. Chen ( Shanghai Institute of Technical Physics (China) )
  • J. Xu ( Shanghai Institute of Technical Physics (China) )
  • L. Wang ( Shanghai Institute of Technical Physics (China) )
  • X. Li ( Shanghai Institute of Technical Physics (China) )
  • Y. Zhang ( Shanghai Institute of Technical Physics (China) )
掲載資料名:
International Symposium on Photoelectronic Detection and Imaging 2007, photoelectronic imaging and detection : 9-12 September 2007, Beijing China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6621
発行年:
2008
開始ページ:
66211D-1
終了ページ:
66211D-10
総ページ数:
10
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819467638 [0819467634]
言語:
英語
請求記号:
P63600/6621
資料種別:
国際会議録

類似資料:

1 国際会議録 The effect of wet chemical etching by KOH solution to the contact on the solar-blind Al0.65Ga0.35N material

L. Wang, J. Chen, Y. Zhang, X. Li

Society of Photo-optical Instrumentation Engineers
7 国際会議録 InGaAs trap detector used as a neor-intrcred transfer standard for detector calibrations [6150-120]

Wang, J., Li, S, Zhang, L., Chen, F., Zheng, X.

SPIE - The International Society of Optical Engineering
2 国際会議録 Back-illuminated GaN/AlGaN visible-blind photodiodes

L. Chen, J. Chen, Y. Bai, L. Guo, Y. Zhang

Society of Photo-optical Instrumentation Engineers
8 国際会議録 Multiband infrared detectors used for spaceborne remote sensing

Fang,J., Xu,G., Zhu,S., Qiu,H., Liu,J., Liang,P., Zhang,F., Lin,X., Zhu,L., Chen,X., Li,X., Gong,H.

SPIE-The International Society for Optical Engineering
3 国際会議録 Study on metal/p-GaN contacts on p-i-n GaN-based UV detectors

X. Li, J. Chen, J. Xu, H. Gong, J. Fang

SPIE - The International Society of Optical Engineering
9 国際会議録 The Effect of Low-Temperature GaAs Nucleation on the Growth of GaN on Silicon(001) During MOVPE Process

Zheng, L. X., Liang, J. W., Yang, H., Li, J. B., Wang, Y. T., Xu, D. P., Li, X. F., Duan, L. H., Hu, X. W.

MRS - Materials Research Society
4 国際会議録 Plasma-induced damage in GaN-based light emitting diodes

Y. Li, X. Yi, X. Wang, J. Guo, L. Wang

Society of Photo-optical Instrumentation Engineers
10 国際会議録 Analysis of the transmission spectra and the parameters extraction of the GaN-based films

C. Li, X. Li, J. Xu, Y. Zhang

Society of Photo-optical Instrumentation Engineers
5 国際会議録 Angled stripe InGaAsP/InP SLED fabricated by low-damage inductively coupled plasma dry etching

Zhang, J., Huang, X.-D., Chang, J., Liu, Y.-J., Gan, Y., Li, L.S., Wang, D.-L., Liu, T., Jiang, S., Deng, L.

SPIE - The International Society of Optical Engineering
11 国際会議録 Visible photo-and electro-luminescence from laser-crystallized a-Si:H and its based multilayers

Chen,K., Wu,W., Huang,X., Li,Z., Wang,M., Xu,J., Li,W., Feng,D.

SPIE-The International Society for Optical Engineering
6 国際会議録 Blind information hiding scheme based on optimum embedding stategy [6045-28]

Zhang L., Qian G., Chen X., Ji Z., Li X.

SPIE - The International Society of Optical Engineering
12 国際会議録 PL study of QDs manufactured by visible light lithography and wet etching

Liu,X., Wan,M., Zhang,B., Chen,X., Lu,W., Shen,S.C.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12