Blank Cover Image

Transmission Electron Microscopy Studies of Oxidation of Single Crystal Silicon Carbide at High Temperature

著者名:
B. Chayasombat
N. Tarumi
T. Kato
T. Hirayama
K. Sasaki
K. Kuroda
さらに 1 件
掲載資料名:
PRICM 6 : selected, peer reviewed papers from The sixth Pacific Rim International Conference on Advanced Materials and Processing, November 5-9, 2007, ICC Jeju, Jeju Island, Korea
シリーズ名:
Materials science forum
シリーズ巻号:
561-565
発行年:
2007
巻:
561-565
パート:
3
開始ページ:
2135
終了ページ:
2138
総ページ数:
4
出版情報:
Uetikon-Zuerich: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878494620 [0878494626]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

類似資料:

1 国際会議録 Microstructural Characterization of Epitaxial Cubic Silicon Carbide Using Transmission Electron Microscopy

B. Chayasombat, Y. Kimata, T. Kato, T. Tokunaga, K. Sasaki

Trans Tech Publications
7 国際会議録 Application of Transmission Electron Microscopy to the Study of Transition Metal Carbides

Epicier. T

Kluwer Academic Publishers
2 国際会議録 Transmission Electron Microscopy Study of Thermal Barrier Coatings Fabricated by Electron Beam-Physical Vapor Deposition

Kato, T., Matsumoto, K., Ishiwata, Y., Hirayama, T., Matsubara, H., Ikuhara, Y., Saka, H.

Trans Tech Publications
8 国際会議録 SiC Single Crystal Growth Rate Measurement by in-Situ Observation using the Transmission X-Ray Technique

Oyanagi, N., Nishizawa, S., Kato, T., Yamaguchi, H., Arai, K.

Trans Tech Publications
3 国際会議録 TRANSMISSION ELECTRON MICROSCOPY STUDIES OF SILICON NITRIDE/SILICON CARBIDE INTERFACES

Kleebe, H-J., Corbin, N., Wilkens, C., Ruhle, M.

Materials Research Society
9 国際会議録 STRUCTURAL STUDIES OF (ZnSe/FeSe) SUPERLATTICES BY TRANSMISSION ELECTRON MICROSCOPY

Park, K., Salamanca-Riba, L., Jonker, B. T.

Materials Research Society
4 国際会議録 Characterization of Electric Discharge Machining for Silicon Carbide Single Crystal

T. Kato, T. Noro, H. Takahashi, S. Yamaguchi, K. Arai

Trans Tech Publications
10 国際会議録 Oxidation of Naphthalene on Palladium Based Catalyst

Sasaki, K., Kunai, A., Kuroda, Y., Kitano, T.

Elsevier
5 国際会議録 Low-Temperature Formation of Gate-Grade Silicon Oxide Films Using High-Density Krypton Plasma

Saito, Y., Sekine, K., Hirayama, M., Ohmi, T.

Electrochemical Society
11 国際会議録 Temperature Dependence of Plasma Chemical Vaporization Machining of Silicon and Silicon Carbide

Y. Sano, M. Watanabe, T. Kato, K. Yamamura, H. Mimura

Trans Tech Publications
6 国際会議録 HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY STUDY OF Se+ IMPALNATED AND ANNEALED GaAs

Sadana, D. K., Sands, T., Washburn, J.

North-Holland
12 国際会議録 HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY OF GaAs/AlAs HETERO-STRUCTURES IN THE <> PROJECTION

Ikarashi, N., Sakai, A., Baba, T., Ishida, K., Motohisa, J., Sakaki, H.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12