Electronic Excitation Induced Solid-State Amorphization in Ge-Sb-Te Alloy

Electronic Excitation Induced Solid-State Amorphization in Ge-Sb-Te Alloy

著者名:

Xian-Bin Li

掲載資料名:

Computational semiconductor materials science : symposium held Spring 2011, April 25-29, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

1370

発行年:

2011

開始ページ:

77

終了ページ:

82

総ページ数:

6

出版情報:

Warrendale, PA: Materials Research Society

ISSN:

02729172

ISBN:

9781605113470 [1605113476]

言語:

英語

請求記号:

M23500/1370

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00051874
シリーズID:	PA00000011
会議名:	2011 MRS Spring Meeting ; Symposium YY, Computational Semiconductor Materials Science
回次:	2011
会議開催地:	San Francisco, CA
会議開催年:	2011.04.25-2011.04.29

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