Measurement of Piezoelectric Transverse and Longitudinal Displacement with Atomic Force Microscopy for PZT Thick Films

Measurement of Piezoelectric Transverse and Longitudinal Displacement with Atomic Force Microscopy for PZT Thick Films

著者名:

Yuta Kashiwagi

掲載資料名:

Advances in spectroscopy and imaging of surfaces and nanostructures : symposium held November 29-December 3, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

1318

発行年:

2011

開始ページ:

167

終了ページ:

172

総ページ数:

6

出版情報:

Warrendale, PA: Materials Research Society

ISSN:

02729172

ISBN:

9781605112954 [160511295X]

言語:

英語

請求記号:

M23500/1318

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00051865
シリーズID:	PA00000011
会議名:	2010 MRS Fall Meeting ; Symposium SS, Advanced Imaging and Scattering Techniques for In Situ Studies ; Symposium TT, In Situ X-Ray Synchrotron Radiation Spectroscopies in Energy-Related Materials Science and Heterogeneous Catalysis ; Symposium UU, Real-Time Studies of Evolving Thin Films and Interfaces ; Symposium VV, Novel Development and Applications of Scanning Probe Microscopy
回次:	2010
会議開催地:	Boston, MA
会議開催年:	2010.11.29-2010.12.03

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