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Effect of High-Temperature Electron Irradiation in Deep Submicron MOSFETs

著者名:
掲載資料名:
Proceedings of the 7th European Conference on Radiation and its Effects on Components and Systems : RADECS 2003, 15-19 September 2003, Noordwijk, the Netherlands
シリーズ名:
ESA SP
シリーズ巻号:
536
発行年:
2004
開始ページ:
443
終了ページ:
450
総ページ数:
8
出版情報:
Noordwijk, the Netherlands: ESA Publication Division
ISSN:
03796566
ISBN:
9789290928461 [9290928468]
言語:
英語
請求記号:
E11690/536
資料種別:
国際会議録

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