Blank Cover Image

CHARACTERIZATION OF DIRECTLY BONDED SILICON-ON-INSULATOR STRUCTURES USING SPECTROSCOPIC ELLIPSOMETRY

著者名:
掲載資料名:
Proceedings of the Second International Symposium on Semiconductor Wafer Bonding--Science, Technology, and Applications
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
1993-29
発行年:
1993
巻:
1993-29
開始ページ:
207
終了ページ:
215
総ページ数:
9
出版情報:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566770682 [1566770688]
言語:
英語
請求記号:
E23400/940556
資料種別:
国際会議録

類似資料:

Nguyen, N.V., Maslar, J.E., Kim, Jin-Yong, Han, Jin-Ping, Park, Jin-Won, Chandler-Horowitz, D., Vogel, E.M.

Materials Research Society

Benamara, M., Rocher, A., Laporte, A., Sarrabayrouse, G., Lescouzeres, L., PeyreLavigne, A., Fnaiech, M., Claverie, A.

MRS - Materials Research Society

Saitoh, T., Kobayashi, D., Kimura, D., Asai, K.

MRS - Materials Research Society

Asinovsky, Leo M., Zierer, Steve

MRS - Materials Research Society

Wong,C.C., Mochizuki,M., Yaguchi,H., Saitoh,T., Xiong,Y.-M.

SPIE-The International Society for Optical Engineering

Asai,K., Watanabe,K., Sameshima,T., Saitoh,T., Xiong,Y.-M.

SPIE-The International Society for Optical Engineering

Watanabe,K., Saitoh,T., Xiong,Y.-M.

SPIE-The International Society for Optical Engineering

Y. Gong, C. Ng, T. Wong

Electrochemical Society

Nozawa, K., Katayama, K., Kanzawa, Y., Sugahara, G., Saitoh, T., Kubo, M.

MRS - Materials Research Society

Sun, Lianchao, Fouere, Jean-Claude, Defranoux, Christophe, Heinrich, Patrice, Reis, Christine Dos, Emeraud, Thierry, …

Materials Research Society

Gubiotti, T., Jacy, D., Hoobler, R.J.

SPIE-The International Society for Optical Engineering

Luis Pereira, Hugo Aguas, Manfred Beckers, Rui M. S. Martins, Elvira Fortunato, Rodrigo Martins

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12