Blank Cover Image

Etching of Silicone Elastomers: Controlled Manipulation of Surface Roughness

著者名:
掲載資料名:
Advances in silicones and silicone-modified materials
シリーズ名:
ACS symposium series
シリーズ巻号:
1051
発行年:
2010
開始ページ:
147
終了ページ:
156
総ページ数:
10
出版情報:
Washington, DC: American Chemical Society
ISSN:
00976156
ISBN:
9780841225596 [0841225591]
言語:
英語
請求記号:
A05800/1051
資料種別:
国際会議録

類似資料:

1 国際会議録 Effect of 4% Cu Addition to Commercially Pure Aluminum Grain Refined by 0.15% V on its Ductility and Surface Roughness

S.M. Al-Qawabah, A.I.O. Zaid, N. Alshabatat

Trans Tech Publications
7 国際会議録 Effect of Surface Roughness on the Adhesion of Elastomers to Hard Surfaces

K. Fuller

Trans Tech Publications
2 国際会議録 Proteins at Silicone Interface

Paul M. Zelisko, Amro M. Ragheb, Michael Hrynyk, Michael A. Brook

American Chemical Society
8 国際会議録 Exploiting Favorable Silicone-Protein Interactions: Stabilization against Denaturation at Oil-Water Interfaces

Zelisko, Paul M., Bartzoka, Vasiliki, Brook, Michael A.

American Chemical Society
3 国際会議録 Damage control during dry etching of EUV mask:I. Control of surface roughness

Hoshino,E., Ogawa,T., Takahashi,M., Hoko,H., Yamanashi,H., Hirano,N., Okazaki,S.

SPIE - The International Society for Optical Engineering
9 国際会議録 Manipulation of Surface Charge on GaN

Josephus D. Ferguson, Michael A. Foussekis, Monika D. Ruchala, J. C. Moore, Michael A. Reshchikov, Alison A. Baski

Materials Research Society
4 国際会議録 Analyses of Size Effect on Surface Roughness in Micro Turning Process

M. Zhao, N. He, L. Li, Z.Q. Liu, W.F. Wu

Trans Tech Publications
10 国際会議録 Development of Si(100) Surface Roughness at the Initial Stage of Etching in F2 and XeF2 Gases - Ellipsometric Study

Aliev, V. S., Kruchinin, V. N.

MRS - Materials Research Society
5 国際会議録 New silicone dielectric elastomers with a high dielectric constant

Z. Zhang, L. Liu, J. Fan, K. Yu, Y. Liu

Society of Photo-optical Instrumentation Engineers
11 国際会議録 Study on Surface Roughness in Ultrasonic High-Speed Milling of SiCp/Al Composites

D.H. Xiang, G.X. Yue, H.T. Liu, B. Zhao

Trans Tech Publications
6 国際会議録 Controlling linewidth roughness in step and flash imprint lithography

G. M. Schmid, N. Khusnatdinov, C. B. Brooks, D. L. LaBrake, E. Thompson

Society of Photo-optical Instrumentation Engineers
12 国際会議録 Dynamic Analysis of Silicone Elastomers

Huba, A., Molnar, L., Czmerk, A., Fischl, T.

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12