Effects of MeV Si Ions Modification on the Thermoelectric Properties of SiO₂/SiO₂+Cu Multilayer Thin Films

Effects of MeV Si Ions Modification on the Thermoelectric Properties of SiO₂/SiO₂+Cu Multilayer Thin Films

著者名:

J. Chacha

掲載資料名:

Thermoelectric materials 2010--growth, properties, novel characterization methods and applications : symposium held April 5-9, 2010, San Francisco, California

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

1267

発行年:

2010

開始ページ:

121

終了ページ:

126

総ページ数:

6

出版情報:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781605112442 [1605112445]

言語:

英語

請求記号:

M23500/1267

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00050343
シリーズID:	PA00000011
会議名:	MRS Spring Meeting : Symposium DD
回次:	2010
会議開催地:	San Francisco, California, USA
会議開催年:	2010.04.05-2010.04.09

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